• DocumentCode
    267715
  • Title

    iJTAG integration of complex digital embedded instruments

  • Author

    Ibrahim, Ahmed ; Kerkhoff, Hans G.

  • Author_Institution
    Testable Design & Test of Integrated Syst. Group, Univ. of Twente, Enschede, Netherlands
  • fYear
    2014
  • fDate
    16-18 Dec. 2014
  • Firstpage
    18
  • Lastpage
    23
  • Abstract
    Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.
  • Keywords
    IEEE standards; automatic test pattern generation; embedded systems; multiprocessing systems; system-on-chip; IEEE 1149.1 TAP port; IEEE 1687; IEEE approved draft standard; MPSoC dependability management solution; complex digital embedded instruments; embedded instruments access; embedded instruments control; iJTAG control; modern SoC; Instruments; Organizations; Ports (Computers); Standards organizations; Synchronization; System-on-chip; Embedded Instruments; IEEE 1687; iJTAG;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (IDT), 2014 9th International
  • Conference_Location
    Algiers
  • Type

    conf

  • DOI
    10.1109/IDT.2014.7038580
  • Filename
    7038580