DocumentCode
2677565
Title
GaAs company Q&R benchmarking results
Author
Roesch, William J.
Author_Institution
TriQuint Semicond. Inc., Beaverton, OR, USA
fYear
1997
fDate
35715
Firstpage
113
Lastpage
116
Abstract
As a result of curiosity from the GaAs Reliability and Quality JEDEC Committee, a benchmarking exercise was chartered. Several companies have provided input to the benchmarking effort. This publication is intended to publicize the investigation and provide general results to the GaAs Community. The intent of this work is to provide baseline information on quality and reliability operations at gallium arsenide manufacturers. This information not only helps each manufacturer understand the other better, but allows for comparisons and development of "common ground" and opportunities for standardization
Keywords
III-V semiconductors; gallium arsenide; quality control; reliability; GaAs; Reliability and Quality JEDEC Committee; company Q&R benchmarking; gallium arsenide manufacturers; quality; reliability; standardization; Acoustic testing; Atomic force microscopy; Failure analysis; Gallium arsenide; Indium tin oxide; Life testing; Manufacturing; Semiconductor device manufacture; Standardization; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
GaAs Reliability Workshop, 1997., Proceedings
Conference_Location
Anaheim, CA
Print_ISBN
0-7908-0064-0
Type
conf
DOI
10.1109/GAASRW.1997.656146
Filename
656146
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