DocumentCode
2678418
Title
Rayleigh and mie enhancement of blackbody radiation in nanoscale devices
Author
Weldon, Thomas P.
Author_Institution
Univ. of North Carolina at Charlotte, Charlotte, NC, USA
fYear
2009
fDate
5-8 March 2009
Firstpage
216
Lastpage
220
Abstract
A method for suppressing long wavelength radiation in blackbody emission is presented. In particular, Rayleigh and Mie theory are considered for the design nanoscale devices to shape the spectrum of blackbody radiation. The method combines the Planck blackbody emission spectrum with the Maxwell equation based suppression of long wavelength radiation from sub-wavelength apertures. In this, constituent nanoscale devices are used as blackbody radiators rather than scatterers of an incident field, a fundamentally different notion than classical scattering of an incident electromagnetic field. In essence, the nanoscale devices serve as an intermediary for converting energy into short-wavelength photons. Although the development focuses on using nanoscale devices to enhance visible wavelength while suppressing infrared, the approach is not limited to optical wavelengths. Results are presented showing potential for reducing the emitted wavelength by 25% to 50%. Finally, the method may prove useful in applications such as energy conversion systems, solar cells, and lighting.
Keywords
Maxwell equations; Mie scattering; Rayleigh scattering; blackbody radiation; electromagnetic fields; Maxwell equation; Mie enhancement; Planck blackbody emission spectrum; Rayleigh enhancement; blackbody radiation; electromagnetic field; energy conversion systems; nanoscale devices; radiation suppression; short-wavelength photons; solar cells; Apertures; Electromagnetic fields; Electromagnetic scattering; Light scattering; Maxwell equations; Mie scattering; Nanoscale devices; Optical scattering; Particle scattering; Rayleigh scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon, 2009. SOUTHEASTCON '09. IEEE
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4244-3976-8
Electronic_ISBN
978-1-4244-3978-2
Type
conf
DOI
10.1109/SECON.2009.5174079
Filename
5174079
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