• DocumentCode
    2678559
  • Title

    Contextual Models for Automatic Building Extraction in High Resolution Remote Sensing Image Using Object-Based Boosting Method

  • Author

    Sun, Xian ; Fu, Kun ; Long, Hui ; Hu, Yanfeng ; Cai, Lun ; Wang, Hongqi

  • Author_Institution
    Inst. of Electron., Chinese Acad. of Sci.
  • Volume
    2
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    Many traditional target extraction methods encountered new challenges as the spatial resolution is increasing quickly. For the purpose of extracting buildings in that circumstance, a new method combing both the object-based approach and boosting algorithm is proposed in this paper. The method associates segmentation with recognition by constructing a hierarchical object network, which effectively improves the problem of detecting targets with a modifiable sliding window existed in other methods. And some useful features are selected automatically to train a validate classifier. Then the label confidence of each object is computed using contextual models to complete the extraction procedure. Competitive results for both multiform and complicated buildings demonstrate the precision, robustness and effectiveness of the proposed method.
  • Keywords
    feature extraction; geophysical techniques; geophysics computing; image recognition; image segmentation; object detection; remote sensing; automatic building extraction; contextual models; hierarchical object network construction; high resolution remote sensing image; image recognition; image segmentation; object-based boosting method; target extraction methods; targets detection; Boosting; Buildings; Context modeling; Image resolution; Image segmentation; Object detection; Remote sensing; Robustness; Spatial resolution; Target recognition; boosting algorithm; building extraction; contextual models; object based; target recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779022
  • Filename
    4779022