• DocumentCode
    267897
  • Title

    Low-cost microbolometer with nano-scaled plasmonic absorbers for far infrared thermal imaging applications

  • Author

    Utermohlen, Fabian ; Etter, Daniel B. ; Borowsky, David ; Herrmann, Ingo ; Schelling, Christoph ; Hutter, Franz X. ; Shen Hue Sun ; Burghartz, Joachim N.

  • Author_Institution
    Corp. Sector Res. & Adv. Eng., Robert Bosch GmbH, Gerlingen, Germany
  • fYear
    2014
  • fDate
    26-30 Jan. 2014
  • Firstpage
    572
  • Lastpage
    575
  • Abstract
    We present a scalable low-cost microbolometer technology platform which is based on separate fabrication of MEMS and read-out ASIC CMOS wafers. Mechanical, electrical and hermetical connection is achieved by Cu-based thermocompression bonding. The performance loss due to the resulting backside illumination of the sensor is compensated by an optimized microbolometer design including nano-scaled plasmonic absorbers, a dedicated pixel geometry and the use of highly temperature sensitive devices. The low-cost approach features CMOS compatible MEMS processes, wafer level packaging and uncooled operation of the sensor.
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; bolometers; image sensors; infrared detectors; infrared imaging; integrated circuit design; integrated circuit manufacture; lead bonding; microfabrication; microsensors; nanosensors; plasmonics; readout electronics; tape automated bonding; temperature sensors; wafer bonding; wafer level packaging; MEMS; backside illumination; electrical connection; far infrared thermal imaging application; hermetical connection; mechanical connection; microbolometer technology platform; microfabrication; nanoscaled plasmonic absorber; pixel geometry; read-out ASIC CMOS wafer; sensor; temperature sensitive device; thermocompression bonding; wafer level packaging; Absorption; Bonding; Micromechanical devices; Plasmons; Temperature; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2014.6765705
  • Filename
    6765705