• DocumentCode
    2679178
  • Title

    FAST-SC: Fast Fault Simulation in Synchronous Sequential circuits

  • Author

    Becker, B. ; Krieger, R.

  • Author_Institution
    J. W. Goethe University
  • fYear
    1993
  • fDate
    3-6 Jan 1993
  • Firstpage
    128
  • Lastpage
    131
  • Keywords
    Acceleration; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Computer science; Computer simulation; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1993. Proceedings. The Sixth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-3180-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1993.669662
  • Filename
    669662
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2679178