• DocumentCode
    2679187
  • Title

    Compact, high-Q, zero temperature coefficient, TE011 sapphire-rutile microwave distributed Bragg reflector resonators

  • Author

    Tobar, Michael E. ; Cros, Dominique ; Blondy, Pierre ; Ivanov, Eugene N.

  • Author_Institution
    Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    493
  • Lastpage
    499
  • Abstract
    Distributed Bragg reflector resonators (DBRR) have been initially suggested in order to improve the quality factor of sapphire loaded cavity (SLC) resonators. They were constructed from thin plates of sapphire designed to confine most of the energy of the resonant mode in free space. Q-factors larger than the dielectric loss limit of sapphire have been obtained using this method. However, these devices are necessarily larger than the whispering gallery (WG) resonators, as they require multiple layers to achieve sufficient confinement. Moreover, they are very sensitive to alignment and a special tool must be manufactured to properly construct the resonator. Finite element analysis of the structure has also revealed a large spurious mode density. Over 50 modes in a 1 GHz range at X-band were discovered. In this paper we introduce the concept of a compact solid microwave DBRR with reduced frequency temperature dependence and a Q-factor close to that of a pure sapphire resonator
  • Keywords
    Q-factor; cavity resonators; crystal resonators; dielectric losses; finite element analysis; microwave oscillators; sapphire; titanium compounds; 1 GHz; Al2O3-TiO2; Q-factors; X-band; dielectric loss limit; finite element analysis; frequency temperature dependence; microwave distributed Bragg reflector resonators; quality factor; resonant mode; sapphire loaded cavity resonators; spurious mode density; Dielectric losses; Distributed Bragg reflectors; Finite element methods; Frequency; Manufacturing; Q factor; Resonance; Solids; Tellurium; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
  • Conference_Location
    Kansas City, MO
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-5838-4
  • Type

    conf

  • DOI
    10.1109/FREQ.2000.887406
  • Filename
    887406