DocumentCode
2679187
Title
Compact, high-Q, zero temperature coefficient, TE011 sapphire-rutile microwave distributed Bragg reflector resonators
Author
Tobar, Michael E. ; Cros, Dominique ; Blondy, Pierre ; Ivanov, Eugene N.
Author_Institution
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
fYear
2000
fDate
2000
Firstpage
493
Lastpage
499
Abstract
Distributed Bragg reflector resonators (DBRR) have been initially suggested in order to improve the quality factor of sapphire loaded cavity (SLC) resonators. They were constructed from thin plates of sapphire designed to confine most of the energy of the resonant mode in free space. Q-factors larger than the dielectric loss limit of sapphire have been obtained using this method. However, these devices are necessarily larger than the whispering gallery (WG) resonators, as they require multiple layers to achieve sufficient confinement. Moreover, they are very sensitive to alignment and a special tool must be manufactured to properly construct the resonator. Finite element analysis of the structure has also revealed a large spurious mode density. Over 50 modes in a 1 GHz range at X-band were discovered. In this paper we introduce the concept of a compact solid microwave DBRR with reduced frequency temperature dependence and a Q-factor close to that of a pure sapphire resonator
Keywords
Q-factor; cavity resonators; crystal resonators; dielectric losses; finite element analysis; microwave oscillators; sapphire; titanium compounds; 1 GHz; Al2O3-TiO2; Q-factors; X-band; dielectric loss limit; finite element analysis; frequency temperature dependence; microwave distributed Bragg reflector resonators; quality factor; resonant mode; sapphire loaded cavity resonators; spurious mode density; Dielectric losses; Distributed Bragg reflectors; Finite element methods; Frequency; Manufacturing; Q factor; Resonance; Solids; Tellurium; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location
Kansas City, MO
ISSN
1075-6787
Print_ISBN
0-7803-5838-4
Type
conf
DOI
10.1109/FREQ.2000.887406
Filename
887406
Link To Document