• DocumentCode
    2679636
  • Title

    Compact modeling of magnetic tunnel junction

  • Author

    Madec, Morgan ; Kammerer, Jean-baptiste ; Pregaldiny, Fabien ; Hebrard, Luc ; Lallement, Christophe

  • Author_Institution
    Centre Nat. de Rech. Sci., Univ. Louis Pasteur, Strasbourg
  • fYear
    2008
  • fDate
    22-25 June 2008
  • Firstpage
    229
  • Lastpage
    232
  • Abstract
    A new compact model of a magnetic tunnel junction (MTJ) is presented in this paper. This model is intended to describe the behavior of a MTJ and to take the magnetic as well as the non-linear electronic transport phenomena into account. It should be suitable for circuits simulation and thus, it must be simple (no finite element approach, analytical current versus voltage characteristic only). For this purpose, some assumptions are made. The MTJ model is separated in two entities. The first one concerns the magnetization of a ferromagnetic thin film. The other focuses on the electrical conduction of a MTJ. Both models are implemented and coupled in VHDL-AMS in order to obtain the compact model of a MTJ, which is parameterized with 25 values (19 physical parameters and 6 semi-empirical ones). The first simulations are encouraging. They allow to retrieve classical results on MTJ and to predict interesting behaviors.
  • Keywords
    circuit simulation; electrical conductivity; ferrimagnetic materials; hardware description languages; magnetic thin film devices; magnetic tunnelling; magnetoelectronics; VHDL-AMS; circuits simulation; compact modeling; electrical conduction; ferromagnetic thin film magnetization; magnetic tunnel junction; nonlinear electronic transport phenomena; Circuit simulation; Couplings; Equations; Insulation; Magnetic analysis; Magnetic separation; Magnetic tunneling; Magnetization; Magnetoelectronics; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems and TAISA Conference, 2008. NEWCAS-TAISA 2008. 2008 Joint 6th International IEEE Northeast Workshop on
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4244-2331-6
  • Electronic_ISBN
    978-1-4244-2332-3
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2008.4606363
  • Filename
    4606363