• DocumentCode
    2680145
  • Title

    Analysis of guided wave signal based on LabVIEW and STFT

  • Author

    Dong, Junhong ; Yin, Ming

  • Author_Institution
    Dept. of Electron. Eng., Naval Univ. of Eng., Wuhan, China
  • Volume
    5
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    115
  • Lastpage
    117
  • Abstract
    Ultrasonic guided wave signal is a dynamic non-stationary. There is a serious phenomenon of frequency dispersion in it. Use of traditional time-domain and frequency domain analysis methods can not reveal the characteristics of spectral change over time. So, we Study the characteristics of the signal characteristics of guided waves, describe the time-frequency analysis theory of short-time Fourier transform (STFT), and realize the STFT algorithm and digital filtering based on LabVIEW software. Carried out STFT and time-frequency spectrum analysis for the guided wave in the steel. And find that frequency components in it change over time. Analysis the mode conversion phenomena of a guided wave, it can more Accurate position the defects. The results show that, when the communication distance is far, STFT can be used for its dynamic signal spectrum analysis and pattern recognition, and using the virtual instrument technology. It will have greater application prospects.
  • Keywords
    Fourier transforms; acoustic signal processing; pattern recognition; spectral analysis; steel; time-frequency analysis; ultrasonic dispersion; ultrasonic propagation; FeCJk; LabVIEW software based digital filtering; dynamic signal spectrum analysis; frequency dispersion; mode conversion; pattern recognition; short-time Fourier transform; steel; time-frequency analysis; ultrasonic guided wave signal; virtual instrument technology; Acoustic distortion; Acoustics; Switches; Time frequency analysis; LabVIEW; STFT; guided wave; time-frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
  • Conference_Location
    Changchun
  • Print_ISBN
    978-1-4244-7957-3
  • Type

    conf

  • DOI
    10.1109/CMCE.2010.5610045
  • Filename
    5610045