• DocumentCode
    268033
  • Title

    Characterisation and simulation of low temperature Si-Si direct bonding through velcro-like surfaces based on porous silicon

  • Author

    Keshavarzi, Shervin ; Mescheder, U. ; Reinecke, Holger

  • Author_Institution
    Inst. of Appl. Res. (IAF), Furtwangen Univ., Furtwangen, Germany
  • fYear
    2014
  • fDate
    26-30 Jan. 2014
  • Firstpage
    1119
  • Lastpage
    1122
  • Abstract
    Velcro-like (needle like) surfaces based on porous silicon can result in strong permanent bonding at room temperature with capability of multiple bonding and un-bonding similar to Velcro® principle. However, understanding of the interaction mechanisms between such surfaces is crucial for employing this type of bonding for wafer or chip bonding and IC packing applications. In this paper, a simple Si technology to create Velcro-like surfaces is described and characterized, and the interaction mechanisms between such surfaces are modelled based on Van der Waals force approach.
  • Keywords
    elemental semiconductors; porous semiconductors; silicon; IC packing applications; Si technology; Si-Si; Van der Waals force approach; Velcro-like surfaces; chip bonding; interaction mechanisms; low temperature Si-Si direct bonding; multiple bonding capability; needle like surfaces; porous silicon; strong permanent bonding; temperature 293 K to 298 K; Bonding; Force; Needles; Silicon; Substrates; Surface morphology; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2014.6765842
  • Filename
    6765842