• DocumentCode
    268035
  • Title

    Long term glass-encapsulated packaging for implant electronics

  • Author

    Chang, Jay Han-Chieh ; Yang Liu ; Yu-chong Tai

  • Author_Institution
    California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2014
  • fDate
    26-30 Jan. 2014
  • Firstpage
    1127
  • Lastpage
    1130
  • Abstract
    Hermetic Titanium-alloy packaging (e.g., used in pacemakers and cochlear implants) has been accepted as the industrial standard for decades. However, two remaining issues of this well-known technology are the size and limited number of feedthroughs [1]. On the other hand, the next generation wireless intraocular retinal prosthetic devices do require unprecedented small size and large number of leads to be fitted inside a human eyeball so the traditional metal packaging is difficult to be implemented. Therefore, these new generation of microimplants will need a new packaging scheme. This paper then reports a new long-term packaging method using glass encapsulation featuring a controlled failure mode from fast diffusion to slow undercut. The results is promising that this new packaging scheme could survive more than 10 years by accelerated “active” lifetime soaking test (i.e., with electric field applied) in 0.9 wt.% saline solution. As a whole, this new method provides several advantages including easy employment, controllable long life time, and enhanced heat dissipation.
  • Keywords
    biomedical electronics; cochlear implants; cooling; electronics packaging; encapsulation; eye; pacemakers; titanium alloys; accelerated active lifetime soaking test; cochlear implants; controllable long life time; controlled failure mode; easy employment; enhanced heat dissipation; fast diffusion; glass encapsulation; hermetic titanium alloy packaging; human eyeball; implant electronics; long term glass-encapsulated packaging; microimplants; next generation wireless intraocular retinal prosthetic devices; pacemakers; slow undercut; Adhesives; Glass; Implants; Metals; Packaging; Retina; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2014.6765844
  • Filename
    6765844