• DocumentCode
    2681000
  • Title

    Patterning of silicide layers by local oxidation

  • Author

    Klinkhammer, F. ; Dolle, M. ; Mantl, S.

  • Author_Institution
    Institut fur Schicht- und lonentechnik
  • fYear
    1997
  • fDate
    16-19 March 1997
  • Firstpage
    199
  • Lastpage
    200
  • Keywords
    Atomic layer deposition; Molecular beam epitaxial growth; Oxidation; Protection; Scanning electron microscopy; Semiconductor process modeling; Silicides; Silicon; Stress; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
  • Conference_Location
    Villard de Lans, France
  • ISSN
    1266-0167
  • Type

    conf

  • DOI
    10.1109/MAM.1998.887574
  • Filename
    887574