• DocumentCode
    2683353
  • Title

    Selectively oxidized vertical-cavity laser performance and technology

  • Author

    Choquette, Kent D. ; Hou, H.Q. ; Geib, K.M. ; Hammons, B.E.

  • Author_Institution
    Center for Compund Semicond. Sci. & Technol., Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    5
  • fYear
    1998
  • fDate
    21-28 Mar 1998
  • Firstpage
    283
  • Abstract
    We discuss revolutionary performance advances in selectively oxidized vertical-cavity surface emitting lasers (VCSELs), which have enabled low operating power laser diodes appropriate for aerospace applications. Incorporating buried oxide layers converted from AlGaAs layers within the laser cavity produces enhanced optical and electrical confinement enabling superior laser performance, such as high efficiency and modulation bandwidth. VCSELs are also shown to be viable over varied environmental conditions such as ambient temperature and ionized radiation. The development of novel VCSEL technologies for advanced system applications is also described. Two-dimensional individually addressable VCSEL arrays exhibit uniform threshold and operating characteristics. Bottom emitting 850 nm VCSEL arrays fabricated using wafer fusion are also reported
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; laser beam applications; optical modulation; semiconductor laser arrays; surface emitting lasers; 850 nm; AlGaAs; aerospace applications; ambient temperature; bottom emitting arrays; buried oxide layers; electrical confinement; individually addressable VCSEL arrays; ionized radiation; modulation bandwidth; operating power; selectively oxidized vertical-cavity laser; surface emitting lasers; threshold characteristics; varied environmental conditions; wafer fusion; Bandwidth; Diode lasers; Ionizing radiation; Optical modulation; Power lasers; Semiconductor laser arrays; Stimulated emission; Surface emitting lasers; Temperature; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 1998 IEEE
  • Conference_Location
    Snowmass at Aspen, CO
  • ISSN
    1095-323X
  • Print_ISBN
    0-7803-4311-5
  • Type

    conf

  • DOI
    10.1109/AERO.1998.685833
  • Filename
    685833