DocumentCode
2684529
Title
Electric field dependence of TDDB activation energy in ultrathin oxides
Author
Vincent, E. ; Evil, N. ; Papadas, C. ; Ghibaudo, G.
Author_Institution
SGS-THOMSON Microelectronics
fYear
1996
fDate
1996
Firstpage
1643
Lastpage
1646
Keywords
Acceleration; Attenuation; Capacitors; Electric breakdown; Extrapolation; Life estimation; Lifetime estimation; Microelectronics; Stress; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888181
Filename
888181
Link To Document