DocumentCode
2685476
Title
Pulsed stress reliability investigations of schottky diodes and HBTS
Author
Schubler, M. ; Krozew, V. ; Bock, K.H. ; Brandt, M. ; Vecc, L. ; Losi, R. ; Hartnagel, H.L.
Author_Institution
Inst. fur Hochfrequenztechnik
fYear
1996
fDate
1996
Firstpage
1907
Lastpage
1910
Keywords
Biological system modeling; Current density; Electrostatic discharge; Heterojunction bipolar transistors; Optical pulses; Performance evaluation; Schottky diodes; Stress; Testing; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888243
Filename
888243
Link To Document