• DocumentCode
    2685720
  • Title

    A suppression method of second order mode spurious responses for boundary acoustic wave filters

  • Author

    Mimura, Masato ; Yamane, Toshiyuki ; Tamazaki, Daisuke

  • Author_Institution
    Murata Manuf. Co., Ltd., Nagaokakyo, Japan
  • fYear
    2012
  • fDate
    7-10 Oct. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we describe a suppression method of spurious responses for boundary acoustic wave filters, which employ a shear-horizontal type boundary acoustic wave in SiN/SiO2/electrodes/LiNbO3 structure. In this structure, the second order mode of boundary acoustic wave is excited strongly and causes a spurious response which deteriorates out-of-band attenuation. We studied the excitation mechanism of the second order mode and found that the intensity of the second order mode depends highly on the relation between the acoustic velocity of the second order mode and the fast shear bulk wave velocity of LiNbO3. Moreover, we found that the change of the propagation direction from the X-axis on rotated V-cut LiNbO3 makes the fast shear bulk wave velocity lower. As a combination of these results, a new suppression method of the spurious responses was proposed. Using this method, a boundary acoustic wave filter without spurious responses was successfully realized.
  • Keywords
    acoustic wave absorption; acoustic wave velocity; electrodes; lithium compounds; silicon compounds; surface acoustic wave filters; SiN-SiO2-LiNbO3; SiN-SiO2-electrode-LiNbO3 structure; X-axis; acoustic velocity; boundary acoustic wave filters; excitation mechanism; fast shear bulk wave velocity; out-of-band attenuation; second order mode intensity; second order mode spurious responses; shear-horizontal type boundary acoustic wave; suppression method; wave propagation direction; Electrodes; Impedance; Lithium niobate; Silicon compounds; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2012 IEEE International
  • Conference_Location
    Dresden
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-4561-3
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2012.0205
  • Filename
    6561908