DocumentCode

2686094

Title

Delay Fault Test Generation with Cellular Aulhomata

Author

Nandi, S. ; Vamsi, B. ; Chakraborty, S. ; Chaudhuri, P. Pal ; Roy, Samir

Author_Institution

Indian Institute of Technology

fYear

1993

fDate

3-6 Jan 1993

Firstpage

281

Lastpage

286

Keywords

Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Logic testing; System testing; Test pattern generators; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 1993. Proceedings. The Sixth International Conference on

ISSN

1063-9667

Print_ISBN

0-8186-3180-5

Type

conf

DOI

10.1109/ICVD.1993.669697

Filename

669697