Efficient multi-parametric uncertainty quantification methods for EMC/EMI applications

For years, statistical uncertainty in high-frequency circuits had been analyzed by post-processing data from repetitive simulations. Not surprisingly, this approach is extremely time consuming and hardly within the time constraints of a typical engineering design cycle. Recently, several new computational algorithms have been presented, which offer a fresh perspective to this old problem. This paper emphasizes approaches that stem from the polynomial chaos expansion method along with promising hybrid methods that can lead to efficient multi-parametric uncertainty quantification solvers.