Toward a BITE for real time MTTF estimation of capacitors

Author

Albertini, Andrea ; Masi, Maria Gabriella ; Mazzanti, Giovanni ; Peretto, Lorenzo ; Tinarelli, Roberto

Author_Institution

Dept. of Electr. Eng., Univ. of Bologna, Bologna, Italy

fYear

2010

fDate

3-6 May 2010

Firstpage

437

Lastpage

442

Abstract

The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis of a suitable life model of the considered device that must relate time to failure with past and present stresses. Model development can be carried out by exploiting the results of a proper measurement campaign. In this paper, a study of the life model for capacitor subjected to thermal stress is performed by presenting the test system and discussing the achieved results.

Keywords

capacitors; computerised monitoring; electronic equipment testing; reliability; thermal stresses; BITE; capacitor; electronic equipment; real time MTTF estimation; real time diagnostic; thermal stress; Aging; Capacitors; Condition monitoring; Electronic equipment; Life testing; Performance evaluation; Preventive maintenance; Temperature; Thermal factors; Thermal stresses; Arrhenius model; capacitor; constant thermal stress; time-varying thermal stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE

Conference_Location

Austin, TX

ISSN

1091-5281

Print_ISBN

978-1-4244-2832-8

Electronic_ISBN

1091-5281

Type

conf

DOI

10.1109/IMTC.2010.5488065

Filename

5488065