DocumentCode
2688572
Title
Evaluate anti-shock property of solder bumps by impact test
Author
Xi, Hongjia ; Lou, Minyi ; An, Bing ; Wu, Fengshun ; Wu, Yiping
Author_Institution
State Key Lab. of Mater. Process. & Die&Mould Technol., Huazhong Univ. of Sci. & Technol., Wuhan
fYear
2008
fDate
28-31 July 2008
Firstpage
1
Lastpage
6
Abstract
Anti-shock property of lead-free Sn96.5-Ag3.0-Cu0.5 solder bumps was investigated by the high speed impact to explore the relation among the fracture modes and the reflow profile and the microstructure of solder joint. Solder bumps were formed with various reflow profiles and multi-reflow and then subjected to the impact test under a constant speed of 1.8 m/s and a shear standoff of 50 mum. The results show that the IMC status has a close relation with the impact behavior upon one reflow. When the heating factor increases beyond 800 s-degC, the thickness of IMC layer goes up, and the impact absorbed energy of solder bump raises quickly. Upon multi-reflow using the same profile, the IMC thickness changed a little but the failure modes varied a lot.
Keywords
copper alloys; fracture; impact (mechanical); materials testing; mechanical testing; silver alloys; solders; tin alloys; Sn96.5-Ag3.0-Cu0.5; anti-shock property; impact test; lead-free solder bumps; multi-reflow; reflow profiles; solder joint; Bonding; Environmentally friendly manufacturing techniques; Intermetallic; Laboratories; Lead; Materials science and technology; Microstructure; Rails; Soldering; Testing; failure mode; fracture; impact test; intermetallic compound; lead-free solder; solder bump;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-2739-0
Electronic_ISBN
978-1-4244-2740-6
Type
conf
DOI
10.1109/ICEPT.2008.4607126
Filename
4607126
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