DocumentCode
2688734
Title
Optimal frequency selection algorithm for ADC frequency domain dynamic tests
Author
Ong, Meng Sang ; Kuang, Ye Chow ; Ooi, Melanie Po-Leen ; Demidenko, Serge ; Soo, Kui Ting ; David, Homer
Author_Institution
Sunway Campus, Monash Univ., Bandar Sunway, Malaysia
fYear
2010
fDate
3-6 May 2010
Firstpage
42
Lastpage
47
Abstract
It is well-known that the proper selection of test frequency and instruments is imperative in successful evaluation of the Analog-to-Digital Converters (ADCs) dynamic performance parameters, such as the signal-to-noise ratio (SNR), signal-to-noise-and-distortion ratio (SINAD), total harmonic distortion (THD) and spurious-free dynamic range (SFDR). The dynamic testing of the ADCs is often performed by means of coherent sampling via frequency domain spectral analysis as it yields more accurate and repeatable test results. Nevertheless, setting up a coherent system requires stringent adherence to various constraints. This paper presents an automatic frequency selection algorithm for ADCs dynamic parameters evaluation.
Keywords
analogue-digital conversion; dynamic testing; harmonic distortion; spectral analysis; THD; analog to digital converter; coherent sampling; distortion ratio; frequency domain dynamic test; frequency domain spectral analysis; optimal frequency selection algorithm; signal-to-noise ratio; spurious free dynamic range; total harmonic distortion; Analog-digital conversion; Dynamic range; Frequency conversion; Frequency domain analysis; Instruments; Performance evaluation; Sampling methods; Signal to noise ratio; Testing; Total harmonic distortion; ADC dynamic testing; Fast Fourier Transform (FFT); coherent sampling; optimal test frequency selection;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location
Austin, TX
ISSN
1091-5281
Print_ISBN
978-1-4244-2832-8
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2010.5488173
Filename
5488173
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