• DocumentCode
    2688767
  • Title

    The impact of die attach material on type II popcorn cracking

  • Author

    Chan, K.C. ; Chai, T.C. ; Wong, E.H. ; Lim, T.B.

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    1998
  • fDate
    8-10 Dec 1998
  • Firstpage
    331
  • Lastpage
    337
  • Abstract
    Recent advances in packaging design, processes and materials have been effective in eliminating or reducing the occurrence of type I and II popcorn failures. However, type II popcorn failures remain prevalent. This paper features a vigorous investigation on the properties of various die attach materials and attempts to correlate the measured properties to the type II popcorn failure rate using a TQFP-208 package. Of the properties evaluated, a high adhesion strength under “hot-wet” conditions consistently exhibited superior popcorn performance. The test measures the adhesion strength between the die and the die-pad at an elevated temperature, after samples have been moisture pre-conditioned. Additionally, the impact of the die attach material properties on package stress and moisture distribution was investigated using finite element analysis. It was found that die attach materials with a high modulus at temperatures above their glass transition temperatures experience less strain due to thermal loading. Moisture diffusion modelling showed that a high moisture absorption die attach material having a high “hot-wet” adhesion can still perform satisfactorily in the popcorn test
  • Keywords
    adhesion; elastic moduli; finite element analysis; glass transition; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; moisture; plastic packaging; surface mount technology; thermal stress cracking; TQFP-208 package; adhesion strength; die attach material; die attach material modulus; die attach material properties; die attach materials; die/die-pad adhesion strength; finite element analysis; glass transition temperature; hot-wet adhesion; hot-wet conditions; moisture diffusion modelling; moisture pre-conditioned samples; package moisture distribution; package stress; packaging design; packaging materials; packaging processes; popcorn performance; popcorn test; thermal loading; type I popcorn failure; type II popcorn cracking; type II popcorn failure; type II popcorn failure rate; Adhesives; Finite element methods; Material properties; Microassembly; Moisture measurement; Packaging; Process design; Temperature; Testing; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
  • Print_ISBN
    0-7803-5141-X
  • Type

    conf

  • DOI
    10.1109/EPTC.1998.756025
  • Filename
    756025