DocumentCode
2688806
Title
Investigation of the adhesion strength between molding compound and leadframe at higher temperatures
Author
Schmidt, R. ; Alpern, Peter ; Plecher, K. ; Tilgner, R.
Author_Institution
Semicond. Group, Siemens AG, Munich, Germany
fYear
1998
fDate
8-10 Dec 1998
Firstpage
349
Lastpage
353
Abstract
The popcorn effect is still a main failure source where the reliability of surface mounted devices is concerned. For thin packages such as P-TSOPs or P-TQFPs, it was found that after preconditioning to level 3 or level 1, the popcorn effect starts from the back side or the top side of the die pad, respectively. Adhesion tests at room temperature could not enlighten this difference, but raised even more questions. To clarify the situation, we investigated the adhesion strength between molding compound and leadframe and between Ag coating and chip adhesive as a function of temperature, Ag coating and moisture content. We also report on investigations of the temperature dependence of different molding compounds and leadframes, with particular emphasis on leadframes with a special coating which showed increased adhesion strength in comparison to uncoated leadframes in popcorn experiments and adhesion tests at room temperature
Keywords
adhesion; adhesives; circuit reliability; encapsulation; metallisation; microassembling; moisture; moulding; surface mount technology; thermal stress cracking; 20 C; Ag; Ag coating; JEDEC preconditioning; P-TQFPs; P-TSOPs; adhesion strength; adhesion tests; chip adhesive; die pad; failure source; leadframe; moisture content; molding compound; molding compounds; popcorn effect; reliability; surface mounted devices; temperature dependence; thin packages; uncoated leadframes; Adhesives; Coatings; Lead compounds; Microassembly; Moisture; Packaging; Qualifications; Soldering; Temperature dependence; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN
0-7803-5141-X
Type
conf
DOI
10.1109/EPTC.1998.756028
Filename
756028
Link To Document