• DocumentCode
    2689102
  • Title

    Optimal clocking and enhanced testability for high-performance self-resetting domino pipelines

  • Author

    Dooply, Ayoob E. ; Yun, Kenneth Y.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
  • fYear
    1999
  • fDate
    21-24 Mar 1999
  • Firstpage
    200
  • Lastpage
    214
  • Abstract
    We describe a method to clock the domino pipeline at the maximum rate by using soft synchronizers between pipeline stages and thus allowing “time borrowing” i.e., allowing input signals to arrive at a pipe stage after the clock tick. We show a robust way of placing “roadblocks” (equivalent to slave latches) in each pipe stage to maintain the optimal clock rate. As explicit latches are not required at the pipe stage boundaries, the latch overhead is eliminated. We use the self-resetting scheme to circumvent often performance-limiting precharge timing requirements. We also address several issues regarding the testability of self-resetting domino circuits including scan register design and multiple stuck fault testing
  • Keywords
    VLSI; delays; design for testability; integrated circuit testing; integrated logic circuits; logic design; logic testing; pipeline processing; synchronisation; timing; DFT; latch overhead elimination; maximum rate; multiple stuck fault testing; optimal clocking; scan register design; self-resetting domino pipelines; soft synchronizers; testability enhancement; Automatic testing; Circuit faults; Circuit testing; Clocks; Latches; Pipelines; Registers; Robustness; Synchronization; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Research in VLSI, 1999. Proceedings. 20th Anniversary Conference on
  • Conference_Location
    Atlanta, GA
  • ISSN
    1522-869X
  • Print_ISBN
    0-7695-0056-0
  • Type

    conf

  • DOI
    10.1109/ARVLSI.1999.756049
  • Filename
    756049