DocumentCode
2689102
Title
Optimal clocking and enhanced testability for high-performance self-resetting domino pipelines
Author
Dooply, Ayoob E. ; Yun, Kenneth Y.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
1999
fDate
21-24 Mar 1999
Firstpage
200
Lastpage
214
Abstract
We describe a method to clock the domino pipeline at the maximum rate by using soft synchronizers between pipeline stages and thus allowing “time borrowing” i.e., allowing input signals to arrive at a pipe stage after the clock tick. We show a robust way of placing “roadblocks” (equivalent to slave latches) in each pipe stage to maintain the optimal clock rate. As explicit latches are not required at the pipe stage boundaries, the latch overhead is eliminated. We use the self-resetting scheme to circumvent often performance-limiting precharge timing requirements. We also address several issues regarding the testability of self-resetting domino circuits including scan register design and multiple stuck fault testing
Keywords
VLSI; delays; design for testability; integrated circuit testing; integrated logic circuits; logic design; logic testing; pipeline processing; synchronisation; timing; DFT; latch overhead elimination; maximum rate; multiple stuck fault testing; optimal clocking; scan register design; self-resetting domino pipelines; soft synchronizers; testability enhancement; Automatic testing; Circuit faults; Circuit testing; Clocks; Latches; Pipelines; Registers; Robustness; Synchronization; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Research in VLSI, 1999. Proceedings. 20th Anniversary Conference on
Conference_Location
Atlanta, GA
ISSN
1522-869X
Print_ISBN
0-7695-0056-0
Type
conf
DOI
10.1109/ARVLSI.1999.756049
Filename
756049
Link To Document