• DocumentCode
    2690719
  • Title

    Analysis and behavioral study on insertion loss of an NLTL circuit

  • Author

    Lan, X. ; Fong, F. ; Kintis, M. ; Wong, T.

  • Author_Institution
    RF Product Center, Northrop Grumman Corp., Redondo Beach, CA
  • fYear
    2006
  • fDate
    9-14 July 2006
  • Firstpage
    883
  • Lastpage
    886
  • Abstract
    A simple method for calculating an NLTL circuit´s loss is presented. This approach is simple and intuitive for understanding and studying the behaviors of insertion loss slopes and spreading effects over frequency at different varactor biasing voltages. Factors that control the insertion loss slope and spreading are identified. In addition, the optimization of insertion loss as a function of circuit interconnection inductance relationship is also reported, with the condition for the existence of optimal range established. The approach and results can be readily applied to different NLTL designs in arriving at optimal NLTL circuits
  • Keywords
    inductance; interconnections; nonlinear network analysis; transmission line theory; varactors; behavioral study; circuit interconnection inductance relationship; insertion loss slopes; nonlinear transmission line structures; optimal NLTL circuit; spreading effects; varactor biasing voltages; Attenuation; Broadband antennas; Diodes; Distributed parameter circuits; Equations; Inductance; Insertion loss; Power transmission lines; Varactors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium 2006, IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    1-4244-0123-2
  • Type

    conf

  • DOI
    10.1109/APS.2006.1710670
  • Filename
    1710670