DocumentCode
2690719
Title
Analysis and behavioral study on insertion loss of an NLTL circuit
Author
Lan, X. ; Fong, F. ; Kintis, M. ; Wong, T.
Author_Institution
RF Product Center, Northrop Grumman Corp., Redondo Beach, CA
fYear
2006
fDate
9-14 July 2006
Firstpage
883
Lastpage
886
Abstract
A simple method for calculating an NLTL circuit´s loss is presented. This approach is simple and intuitive for understanding and studying the behaviors of insertion loss slopes and spreading effects over frequency at different varactor biasing voltages. Factors that control the insertion loss slope and spreading are identified. In addition, the optimization of insertion loss as a function of circuit interconnection inductance relationship is also reported, with the condition for the existence of optimal range established. The approach and results can be readily applied to different NLTL designs in arriving at optimal NLTL circuits
Keywords
inductance; interconnections; nonlinear network analysis; transmission line theory; varactors; behavioral study; circuit interconnection inductance relationship; insertion loss slopes; nonlinear transmission line structures; optimal NLTL circuit; spreading effects; varactor biasing voltages; Attenuation; Broadband antennas; Diodes; Distributed parameter circuits; Equations; Inductance; Insertion loss; Power transmission lines; Varactors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location
Albuquerque, NM
Print_ISBN
1-4244-0123-2
Type
conf
DOI
10.1109/APS.2006.1710670
Filename
1710670
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