• DocumentCode
    2692001
  • Title

    On-state characteristics of SiC thyristors for the 8–20 kV regime

  • Author

    Walden, G.G. ; Cooper, J.A.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2009
  • fDate
    22-24 June 2009
  • Firstpage
    91
  • Lastpage
    92
  • Abstract
    Silicon carbide is attractive for high-voltage power switching applications because its critical field is 8-10x higher than silicon. In SiC MOSFETs, the drift region resistance increases as the square of the blocking voltage, and for sufficiently high voltages (>10 kV) this resistance becomes a major limitation. Bipolar devices (BJTs, IGBTs, and thyristors) inject minority carriers into the drift region, resulting in conductivity modulation that dramatically reduces this resistance. BJTs and IGBTs are single-injection devices, but thyristors inject carriers into the drift region from both sides, resulting in increased conductivity modulation. Hence, thyristors are attractive for high-voltage, low-frequency applications such as electric power utility distribution.
  • Keywords
    MOSFET; silicon compounds; thyristors; SiC; SiC MOSFET; SiC thyristors; bipolar devices; blocking voltage; conductivity modulation; drift region resistance; high-voltage power switching; on-state characteristics; silicon carbide; Annealing; Anodes; Conductivity; Electric resistance; Fingers; Insulated gate bipolar transistors; Silicon carbide; Temperature; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2009. DRC 2009
  • Conference_Location
    University Park, PA
  • Print_ISBN
    978-1-4244-3528-9
  • Electronic_ISBN
    978-1-4244-3527-2
  • Type

    conf

  • DOI
    10.1109/DRC.2009.5354855
  • Filename
    5354855