DocumentCode
2694299
Title
Test stand for linear induction accelerator optimization
Author
Ong, Mike ; DeHope, Bill ; Griffin, Ken ; Goerz, Dave ; Kihara, Ron ; Vogtlin, George ; Zentler, Jan Mark ; Scarpetti, Ray
Author_Institution
Lawrence Livermore Nat. Lab., CA, USA
Volume
2
fYear
2003
fDate
15-18 June 2003
Firstpage
909
Abstract
Lawrence Livermore National Laboratory has designed and constructed a test stand to improve the voltage regulation in our flash X-Ray (FXR) accelerator cell. The goal is to create a more mono-energetic electron beam that creates an X-ray source with a smaller spot size. Studying the interaction of the beam and pulse-power system with the accelerator cell improves the design of high-current accelerators at Livermore and elsewhere. On the test stand, a standard FXR cell is driven by a flexible pulse-power system and the beam current is simulated with a switched center conductor. The test stand is fully instrumented with high-speed digitizers to document the effect of impedance mis-matches when the cell is operated under various full-voltage conditions. A time-domain reflectometry technique was also developed to characterize the beam and cell interactions by measuring the impedance of the accelerator and pulse-power component. Computer models are being developed in parallel with the testing program to validate the measurements and evaluate different design changes. Both 3D transient electromagnetic and circuit models are being used.
Keywords
X-rays; electron beams; linear accelerators; optimisation; pulsed power supplies; Lawrence Livermore National Laboratory; X-ray source; electron beam; flash X-Ray accelerator cell; linear induction accelerator optimization; pulse-power system; test stand; Electromagnetic measurements; Electron beams; Impedance; Laboratories; Life estimation; Linear accelerators; Particle beams; Pulse measurements; Testing; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-7915-2
Type
conf
DOI
10.1109/PPC.2003.1277958
Filename
1277958
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