DocumentCode
2694558
Title
Millimeter-Wave Material Properties and Measurements
Author
Simonis, G.J.
Volume
2
fYear
1987
fDate
May 9 1975-June 11 1987
Firstpage
747
Lastpage
748
Abstract
Emerging millimeter-wave (MMW) applications require reliable data on the MMW properties of materials. An overview is given of some of these requirements, the nature and limitation of the available data, the means of obtaining such data, and the progress that is being made in characterizing the MMW properties of materials.
Keywords
Absorption; Conducting materials; Crystalline materials; Dielectric materials; Material properties; Millimeter wave measurements; Millimeter wave technology; Optical materials; Optical waveguides; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location
Palo Alto, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1987.1132520
Filename
1132520
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