• DocumentCode
    2694585
  • Title

    Electron microscopy experiments concerning hysteresis in the magnetic lens system

  • Author

    van Bree, P.J. ; van Lierop, C.M.M. ; van den Bosch, P.P.J.

  • Author_Institution
    Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
  • fYear
    2010
  • fDate
    8-10 Sept. 2010
  • Firstpage
    956
  • Lastpage
    961
  • Abstract
    Ferromagnetic hysteresis and coupled dynamics in the magnetic lens system of electron microscopes degrade the machine´s performance in terms of steady-state error and transition time. To get a clear understanding of the exact problem and the way it is expressed in the application a commercial scanning electron microscope is extended with a data-acquisition and rapid proto-typing system. By means of conditioned experiments the significance of the hysteresis effects for microscopy applications is quantified. The response is evaluated by an analysis of synchronized lens currents and estimated sharpness of the resulting images. The sensitivity of image sharpness versus input variation is obtained in a local operating point. The hysteresis effect and its coupling with dynamics, as a response to changes over the complete working range, result in a significant deviation in image sharpness. Since the magnetic field is not available for measurement, the error is expressed in the quasi-static input variation required to correct for it. In order to get a good understanding of the observed effects and the magnetic lens as a system, an interconnected dynamics-hysteresis-electron optics model is used to analyze and to reproduce the experimental results.
  • Keywords
    magnetic hysteresis; magnetic lenses; scanning electron microscopes; data acquisition; electron microscopy; ferromagnetic hysteresis; image sharpness; magnetic lens system; quasi-static input variation; rapid prototyping; scanning electron microscope; steady-state error; transition time; Lenses; Magnetic force microscopy; Magnetic hysteresis; Magnetic resonance imaging; Microscopy; Saturation magnetization; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications (CCA), 2010 IEEE International Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-5362-7
  • Electronic_ISBN
    978-1-4244-5363-4
  • Type

    conf

  • DOI
    10.1109/CCA.2010.5611224
  • Filename
    5611224