DocumentCode
2694734
Title
Hybrid superconducting-magnetic fault current limiter
Author
Altgilbers, L.L. ; Balevicius, S. ; Zurauskiene, N. ; Stankevic, V. ; Cimmperman, P. ; Anisimovas, F.
Author_Institution
US Army & Missile Defense Command, Huntsville, AL, USA
Volume
2
fYear
2003
fDate
15-18 June 2003
Firstpage
1040
Abstract
This limiter is intended to protect high-speed electronic circuits from subnanosecond duration high voltage transients. It operates at liquid nitrogen temperature and could be used in cryogenic electronic systems based on high-T/sub c/ superconducting devices. The device operates because of electric current induced switching from the superconducting state to the normal state and electric field induced resistance changes in manganite. The attenuation in high-speed transmission lines occurs, when, as the result of the action of a current pulse, the resistance of the superconducting Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-x/ strip, connected in series with the transmission line, increases, while the resistance of the manganite La/sub 0.67/Ca/sub 0.33/MnO/sub 3/ film, connected in parallel to this line, decreases. The attenuation achieved by such limiters exceeds 20-30 dB. In its non-attenuating regime, the bandwidth of the device could be up to 18 GHz.
Keywords
fault current limiters; high-temperature superconductors; superconducting transition temperature; yttrium compounds; 18 GHz; 20 to 30 dB; La/sub 0.67/Ca/sub 0.33/MnO/sub 3/; Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-x/; cryogenic electronic systems; electric current induced switching; high voltage transients; high-speed electronic circuits; liquid nitrogen temperature; manganite; superconducting devices; superconducting-magnetic fault current limiter; Attenuation; Circuits; Electric resistance; Fault current limiters; High-speed electronics; Nitrogen; Power system transients; Protection; Superconducting transmission lines; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-7915-2
Type
conf
DOI
10.1109/PPC.2003.1277990
Filename
1277990
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