DocumentCode
2696099
Title
Accuracy improvement of ray-launching approach for indoor wave propagation through high lossy walls
Author
Sato, Ryoichi ; Sato, Hiroshi ; Shirai, Hiroshi
Author_Institution
Fac. of Educ. & Human Sci., Niigata Univ.
fYear
2006
fDate
9-14 July 2006
Firstpage
2157
Lastpage
2160
Abstract
This paper focuses on the transmitted wave through an indoor wall, which is composed by high lossy dielectric material. According to the Snell´s law, refracted propagation (real) angle thetast may be extended to a complex angle thetascirct for such lossy dielectric case. Especially, if the lossy effect of the wall material is large, Jfrm{thetascirct} may not be negligible small. In the ray-launching procedure, the complex angle thetascirct must be replaced with real shooting angle thetast, when one needs to calculate the transmitted ray through the wall. However, it is not clear how one determines the appropriate real shooting direction thetast inside the wall when the refracted angle becomes complex. In order to clarify the above question, this paper considers how to determine the appropriate real refracted angle thetast, by comparing the numerical ray-launching solution with the analytically derived reference solution. Accuracy improvement for higher lossy material cases is also discussed. Here time harmonic factor e-iwt is assumed and suppressed throughout the context
Keywords
dielectric materials; electromagnetic wave refraction; indoor communication; radiowave propagation; Snell law; accuracy improvement; analytically derived reference solution; complex angle; high lossy dielectric material; high lossy walls; indoor wall; indoor wave propagation; numerical ray-launching solution; refracted propagation angle; shooting direction; time harmonic factor; Broadband communication; Dielectric losses; Dielectric materials; Humans; Optical scattering; Propagation losses; Reflection; Slabs; Space technology; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location
Albuquerque, NM
Print_ISBN
1-4244-0123-2
Type
conf
DOI
10.1109/APS.2006.1711013
Filename
1711013
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