SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

Author

Meng, L. ; Nagalingam, D. ; Bhatia, C.S. ; Street, A.G. ; Phang, J.C.H.

Author_Institution

Centre for Integrated Circuit Failure Anal. & Reliability (CICFAR), Nat. Univ. of Singapore, Singapore, Singapore

fYear

2010

fDate

2-6 May 2010

Firstpage

503

Lastpage

507

Abstract

Morphological and electrical defects in solar cells are distinguished by combining Scanning Electron Acoustic Microscopy (SEAM) and Electron Beam Induced Current (EBIC) techniques. These techniques provide complementary information on grain boundaries and defects that affect solar cell performance in different ways.

Keywords

EBIC; acoustic microscopy; elemental semiconductors; grain boundaries; scanning electron microscopy; silicon; solar cells; EBIC studies; SEAM studies; electron beam induced current techniques; grain boundaries complementary information; polycrystalline solar cells electrical defects; polycrystalline solar cells morphological defects; scanning electron acoustic microscopy; Acoustic beams; Acoustic imaging; Acoustic signal detection; Acoustic waves; Blanking; Electron beams; Photovoltaic cells; Scanning electron microscopy; Silicon; Solar power generation; EBIC; Electron Beam; Induced Current; SEAM; Scanning Electron Acoustic Microscopy; electrical defects; morphological defects; solar cell;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium (IRPS), 2010 IEEE International

Conference_Location

Anaheim, CA

ISSN

1541-7026

Print_ISBN

978-1-4244-5430-3

Type

conf

DOI

10.1109/IRPS.2010.5488781

Filename

5488781