• DocumentCode
    269933
  • Title

    Projection-Based Ensemble Learning for Ordinal Regression

  • Author

    Perez-Ortiź, Mariá ; Gutierrez, Pedro Antonio ; Hervás-Martínez, César

  • Author_Institution
    Dept. of Comput. Sci. & Numerical Anal., Univ. of Cordoba, Cordoba, Spain
  • Volume
    44
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    681
  • Lastpage
    694
  • Abstract
    The classification of patterns into naturally ordered labels is referred to as ordinal regression. This paper proposes an ensemble methodology specifically adapted to this type of problem, which is based on computing different classification tasks through the formulation of different order hypotheses. Every single model is trained in order to distinguish between one given class (k) and all the remaining ones, while grouping them in those classes with a rank lower than k, and those with a rank higher than k. Therefore, it can be considered as a reformulation of the well-known one-versus-all scheme. The base algorithm for the ensemble could be any threshold (or even probabilistic) method, such as the ones selected in this paper: kernel discriminant analysis, support vector machines and logistic regression (LR) (all reformulated to deal with ordinal regression problems). The method is seen to be competitive when compared with other state-of-the-art methodologies (both ordinal and nominal), by using six measures and a total of 15 ordinal datasets. Furthermore, an additional set of experiments is used to study the potential scalability and interpretability of the proposed method when using LR as base methodology for the ensemble.
  • Keywords
    learning (artificial intelligence); pattern classification; regression analysis; support vector machines; classification tasks; ensemble methodology; kernel discriminant analysis; logistic regression; one-versus-all scheme; order hypothesis; ordinal regression; pattern classification; probabilistic method; projection-based ensemble learning; support vector machines; Discriminant analysis; ensemble; logistic regression; ordinal classification; ordinal decomposition; ordinal regression; support vector machines; threshold models;
  • fLanguage
    English
  • Journal_Title
    Cybernetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2168-2267
  • Type

    jour

  • DOI
    10.1109/TCYB.2013.2266336
  • Filename
    6548013