Product failures: Power-law or exponential voltage dependence?

Author

Haggag, Amr ; Forbes, Keith ; Anderson, Gary ; Burnett, Dave ; Abramowitz, Peter ; Moosa, Mohamed

Author_Institution

Freescale Semicond., Austin, TX, USA

fYear

2010

fDate

2-6 May 2010

Firstpage

125

Lastpage

128

Abstract

The product failures voltage acceleration has traditionally been modelled with exponential voltage dependence. However with voltage scaling, the voltage acceleration parameter (VAP) in an exponential model has increased as V^-1 - as expected for dielectric breakdown in either back-end or front-end. This suggests an exponential model is probably quite conservative and a power-law model may be more appropriate for 90 nm and beyond. Even if an exponential model continues to be used, this understanding can help assess the amount of conservatism built in such a model.

Keywords

electric breakdown; life testing; reliability; dielectric breakdown; exponential voltage dependence model; power-law dependence; product failure voltage acceleration; size 90 nm; voltage acceleration parameter; Acceleration; Breakdown voltage; Cost function; Dielectric breakdown; Failure analysis; Maintenance; Product design; Stress; Temperature dependence; Testing; TDDB; exponential; extrinsic; powerlaw; product; voltage acceleration;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium (IRPS), 2010 IEEE International

Conference_Location

Anaheim, CA

ISSN

1541-7026

Print_ISBN

978-1-4244-5430-3

Type

conf

DOI

10.1109/IRPS.2010.5488840

Filename

5488840