• DocumentCode
    2700682
  • Title

    Optimal Estimation of Rejection Thresholds for Topic Spotting

  • Author

    Subramanian, Kartick ; Prasad, Ranga ; Natarajan, Prem ; Schwartz, R.

  • Author_Institution
    BBN Technol., Cambridge, MA, USA
  • Volume
    4
  • fYear
    2007
  • fDate
    15-20 April 2007
  • Abstract
    In many applications of topic spotting technology, especially those that require a human review of in-topic documents, a low false alarm rate is a key requirement. Topic spotting techniques typically include a rejection scheme to filter out off-topic documents. In this paper we present a robust methodology for rejecting off-topic messages that, in addition to modeling the topics of interest, uses a so-called alternate model for topics that are not included in the set of topics of interest. Specifically, we introduce two novel techniques for estimating topic-specific rejection thresholds - a parametric technique that can be viewed as transformation of topic-independent thresholds, and a nonparametric technique based on constrained optimization of false rejections subject to a pre-specified number of false acceptances. Our experiments on newsgroup messages demonstrate that when adequate training data is available topic-specific threshold estimation techniques can outperform topic-independent thresholds in terms of the ROC curve.
  • Keywords
    document handling; pattern classification; false acceptances; false rejections subject; in-topic documents; nonparametric technique; off-topic documents; rejection thresholds; topic classification; topic spotting; topic-independent thresholds; topic-specific rejection thresholds; Broadcasting; Classification algorithms; Constraint optimization; Filters; Hidden Markov models; Humans; IP networks; Probability distribution; Robustness; Training data; Hidden Markov Models; Rejection Algorithms; Topic Classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2007. ICASSP 2007. IEEE International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1520-6149
  • Print_ISBN
    1-4244-0727-3
  • Type

    conf

  • DOI
    10.1109/ICASSP.2007.367168
  • Filename
    4218042