Microstrip fixture for testing thin magnetic films

Author

Kirschenmann, Korey ; Amert, Tony ; Whites, Keith W.

Author_Institution

Dept. of Electr. & Comput. Eng., South Dakota Sch. of Mines & Technol., Rapid City, SD

fYear

2006

fDate

9-14 July 2006

Firstpage

3195

Lastpage

3198

Abstract

Electromagnetic characterization of thin magnetic films is a challenging task. This paper proposes a new device to test magnetic materials developed for use at microwave frequencies and deposited by the Maskless Mesoscale Material Deposition (M³Dtrade) or other processes. This new type of test fixture is compatible with M³Dtrade deposition requirements, simple to use, and provides a simple inexpensive test for the magnetic properties of thin films independently from their electrical properties in certain circumstances

Keywords

magnetic microwave devices; magnetic thin films; materials testing; microstrip circuits; microstrip couplers; microwave materials; Maskless Mesoscale Material Deposition; electrical properties; electromagnetic characterization; magnetic materials testing; magnetic properties; microstrip fixture; microwave frequencies; thin magnetic films testing; Circuit testing; Dielectric thin films; Fixtures; Magnetic films; Magnetic materials; Materials testing; Microstrip; Permeability; Permittivity measurement; Resonant frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium 2006, IEEE

Conference_Location

Albuquerque, NM

Print_ISBN

1-4244-0123-2

Type

conf

DOI

10.1109/APS.2006.1711290

Filename

1711290