• DocumentCode
    2701363
  • Title

    A 0.18 /spl mu/m CMOS hot-standby phase-locked loop using a noise-immune adaptive-gain voltage-controlled oscillator

  • Author

    Mizuno, M. ; Furuta, K. ; Andoh, T. ; Tanabe, A. ; Tamura, T. ; Miyamoto, H. ; Furukawa, A. ; Yamashina, M.

  • Author_Institution
    NEC Corp., Kanagawa, Japan
  • fYear
    1995
  • fDate
    15-17 Feb. 1995
  • Firstpage
    268
  • Lastpage
    269
  • Abstract
    This PLL features a hot-standby PLL (HSPLL) architecture and noise-immune circuit techniques. With this architecture, both fast lock time and low jitter are achieved by the system transfer function being changed; it is unnecessary to vary the values of system parameters in an attempt to reduce lock time. The HSPLL uses a reconfigurable delay line (RDL) that, depending upon the state of its switch circuit (SC), can operate either as a voltage-controlled delay line (VCDL) or a voltage-controlled oscillator (VCO). When the RDL is operating as a VCDL (i.e. when the total circuit is a VCDL-PLL, a first-order system), lock time is fast and jitter is low, but it is difficult to generate a frequency-multiplied signal. This makes the VCDL-PLL configuration appropriate for the unlocked state. Then, at the instant that the HSPLL changes from the unlocked state to the locked, the condition of the SC is changed to create a VCO-PLL, a second-order system in which it is easy to generate a frequency-multiplied signal but difficult to achieve fast lock time (i.e. a situation well-suited to a locked state). This HSPLL architecture allows use of the respective advantages of both VCDL- and VCO-PLLs without having to suffer from their various disadvantages. The HSPLL is implemented in 0.18 /spl mu/m CMOS and two-layer metal technology. 2010 transistors are integrated into a 480/spl times/450 /spl mu/m/sup 2/ die area. The supply voltage is 1.0 V, the power dissipation is about 2 mW, the input signal frequency is 50 MHz, and the output signal frequency is 200 MHz.
  • Keywords
    CMOS digital integrated circuits; delay lines; digital phase locked loops; integrated circuit noise; interference suppression; jitter; voltage-controlled oscillators; 0.18 micron; 1 V; 2 mW; 200 MHz; 50 MHz; CMOS hot-standby PLL; adaptive-gain VCO; fast lock time; first-order system; frequency-multiplied signal; low jitter; noise-immune circuit techniques; phase-locked loop; reconfigurable delay line; second-order system; switch circuit; transfer function; two-layer metal technology; voltage-controlled delay line; voltage-controlled oscillator; Circuit noise; Delay lines; Frequency; Jitter; Phase locked loops; Signal generators; Switches; Switching circuits; Transfer functions; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1995. Digest of Technical Papers. 41st ISSCC, 1995 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0193-6530
  • Print_ISBN
    0-7803-2495-1
  • Type

    conf

  • DOI
    10.1109/ISSCC.1995.535551
  • Filename
    535551