DocumentCode
2701363
Title
A 0.18 /spl mu/m CMOS hot-standby phase-locked loop using a noise-immune adaptive-gain voltage-controlled oscillator
Author
Mizuno, M. ; Furuta, K. ; Andoh, T. ; Tanabe, A. ; Tamura, T. ; Miyamoto, H. ; Furukawa, A. ; Yamashina, M.
Author_Institution
NEC Corp., Kanagawa, Japan
fYear
1995
fDate
15-17 Feb. 1995
Firstpage
268
Lastpage
269
Abstract
This PLL features a hot-standby PLL (HSPLL) architecture and noise-immune circuit techniques. With this architecture, both fast lock time and low jitter are achieved by the system transfer function being changed; it is unnecessary to vary the values of system parameters in an attempt to reduce lock time. The HSPLL uses a reconfigurable delay line (RDL) that, depending upon the state of its switch circuit (SC), can operate either as a voltage-controlled delay line (VCDL) or a voltage-controlled oscillator (VCO). When the RDL is operating as a VCDL (i.e. when the total circuit is a VCDL-PLL, a first-order system), lock time is fast and jitter is low, but it is difficult to generate a frequency-multiplied signal. This makes the VCDL-PLL configuration appropriate for the unlocked state. Then, at the instant that the HSPLL changes from the unlocked state to the locked, the condition of the SC is changed to create a VCO-PLL, a second-order system in which it is easy to generate a frequency-multiplied signal but difficult to achieve fast lock time (i.e. a situation well-suited to a locked state). This HSPLL architecture allows use of the respective advantages of both VCDL- and VCO-PLLs without having to suffer from their various disadvantages. The HSPLL is implemented in 0.18 /spl mu/m CMOS and two-layer metal technology. 2010 transistors are integrated into a 480/spl times/450 /spl mu/m/sup 2/ die area. The supply voltage is 1.0 V, the power dissipation is about 2 mW, the input signal frequency is 50 MHz, and the output signal frequency is 200 MHz.
Keywords
CMOS digital integrated circuits; delay lines; digital phase locked loops; integrated circuit noise; interference suppression; jitter; voltage-controlled oscillators; 0.18 micron; 1 V; 2 mW; 200 MHz; 50 MHz; CMOS hot-standby PLL; adaptive-gain VCO; fast lock time; first-order system; frequency-multiplied signal; low jitter; noise-immune circuit techniques; phase-locked loop; reconfigurable delay line; second-order system; switch circuit; transfer function; two-layer metal technology; voltage-controlled delay line; voltage-controlled oscillator; Circuit noise; Delay lines; Frequency; Jitter; Phase locked loops; Signal generators; Switches; Switching circuits; Transfer functions; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1995. Digest of Technical Papers. 41st ISSCC, 1995 IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
0193-6530
Print_ISBN
0-7803-2495-1
Type
conf
DOI
10.1109/ISSCC.1995.535551
Filename
535551
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