• DocumentCode
    2701639
  • Title

    High resolution optical microscopy with electron-beam excitation

  • Author

    Inami, Wataru ; Nawa, Yasunori ; Ono, Atsushi ; Kawata, Yoshimasa

  • Author_Institution
    Div. of Global Res. Leaders, Shizuoka Univ., Hamamatsu, Japan
  • fYear
    2011
  • fDate
    17-19 Oct. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We have developed an electron beam excitation assisted near-field scanning optical microscope and demonstrated resolution greater than 50 nm. The microscope has a few tens nanometer spatial resolution laterally and makes it possible to observe dynamic behaviors of living biological specimens in various surroundings such as air or liquids. In the microscope, a light source in a few nanometers size is excited by focused electron beam in a luminescent film. Scan speed of nanometric light source is faster than that of the small aperture in conventional near-field scanning optical microscopes. The optical near-field microscope enables to observe optical constants such as absorption, refractive index, polarization properties, and its dynamic behaviors in nanometer scale. The developed microscope opens new microscopy applications to in nano-technology and nano-science. We also present direct excitation of fluorescented labelling cells.
  • Keywords
    absorption coefficients; cellular biophysics; electron optics; light polarisation; light sources; near-field scanning optical microscopy; optical films; refractive index; absorption constants; dynamic properties; electron-beam excitation; fluorescented labelling cells; high resolution optical microscopy; light source; living biological specimens; luminescent film; nanometer spatial resolution; near-field scanning optical microscope; optical constants; polarization properties; refractive index; Electron microscopy; Image resolution; Optical fibers; Optical imaging; Optical microscopy; Optical scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics (ICP), 2011 IEEE 2nd International Conference on
  • Conference_Location
    Kata Kinabalu
  • Print_ISBN
    978-1-61284-265-3
  • Electronic_ISBN
    978-1-61284-263-9
  • Type

    conf

  • DOI
    10.1109/ICP.2011.6106810
  • Filename
    6106810