DocumentCode
2702547
Title
Testing micropipelines
Author
Khoche, Ajay ; Brunvand, Erik
Author_Institution
Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA
fYear
1994
fDate
3-5 Nov 1994
Firstpage
239
Lastpage
246
Abstract
Micropipelines, self-timed event-driven pipelines, are an attractive way of structuring asynchronous systems that exhibit many of the advantages of general asynchronous systems, but enough structure to make the design of significant systems practical. As with any design method, testing is critical. We present a technique for testing self-timed micropipelines for stuck-at faults and for delay faults in the bundled data paths by modifying the latch and control elements to include a built-in scan path for testing. This scan path allows the processing logic in the micropipeline, as well as the control of the micropipeline, to be fully tested with only a small overhead an the latch and control circuits. The test method is very similar to scan testing in synchronous systems, but the micropipeline retains its self-timed behavior during normal operation
Keywords
asynchronous circuits; asynchronous systems; built-in scan path; bundled data paths; delay faults; general asynchronous systems; latch and control elements; micropipelines testing; processing logic; self-timed behavior; self-timed event-driven pipelines; self-timed micropipelines; stuck-at faults; synchronous systems; Automatic testing; Circuit faults; Circuit testing; Delay; Design methodology; Latches; Logic circuits; Logic testing; Pipelines; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Research in Asynchronous Circuits and Systems, 1994., Proceedings of the International Symposium on
Conference_Location
Salt Lake City, UT
Print_ISBN
0-8186-6210-7
Type
conf
DOI
10.1109/ASYNC.1994.656316
Filename
656316
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