• DocumentCode
    2702547
  • Title

    Testing micropipelines

  • Author

    Khoche, Ajay ; Brunvand, Erik

  • Author_Institution
    Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA
  • fYear
    1994
  • fDate
    3-5 Nov 1994
  • Firstpage
    239
  • Lastpage
    246
  • Abstract
    Micropipelines, self-timed event-driven pipelines, are an attractive way of structuring asynchronous systems that exhibit many of the advantages of general asynchronous systems, but enough structure to make the design of significant systems practical. As with any design method, testing is critical. We present a technique for testing self-timed micropipelines for stuck-at faults and for delay faults in the bundled data paths by modifying the latch and control elements to include a built-in scan path for testing. This scan path allows the processing logic in the micropipeline, as well as the control of the micropipeline, to be fully tested with only a small overhead an the latch and control circuits. The test method is very similar to scan testing in synchronous systems, but the micropipeline retains its self-timed behavior during normal operation
  • Keywords
    asynchronous circuits; asynchronous systems; built-in scan path; bundled data paths; delay faults; general asynchronous systems; latch and control elements; micropipelines testing; processing logic; self-timed behavior; self-timed event-driven pipelines; self-timed micropipelines; stuck-at faults; synchronous systems; Automatic testing; Circuit faults; Circuit testing; Delay; Design methodology; Latches; Logic circuits; Logic testing; Pipelines; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Research in Asynchronous Circuits and Systems, 1994., Proceedings of the International Symposium on
  • Conference_Location
    Salt Lake City, UT
  • Print_ISBN
    0-8186-6210-7
  • Type

    conf

  • DOI
    10.1109/ASYNC.1994.656316
  • Filename
    656316