• DocumentCode
    2702833
  • Title

    Epoxy-additive interaction studies of thermally reworkable underfills for flip-chip applications

  • Author

    Wang, Lejun ; Wong, C.P.

  • Author_Institution
    Center for Packaging Res., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1999
  • fDate
    14-17 Mar 1999
  • Firstpage
    356
  • Lastpage
    361
  • Abstract
    Underfill encapsulant is the material used in flip-chip devices that fills the gap between the IC chip and the organic board and encapsulates the solder interconnects. This underfill material can dramatically enhance the reliability of flip-chip devices as compared to nonunderfilled devices. Current underfill encapsulants are mainly silica filled epoxy-based materials that are not reworkable after curing, which places an obstacle in flip chip technology developments, where unknown bad die is still a concern. Reworkable underfill encapsulant is the key to address the nonreworkability of the FCOB packages. The goal of this study is to develop epoxy-based thermally reworkable underfills. This paper presents work in development of additive-modified epoxies. Previous work showed that two special additives, when incorporated into the epoxy matrix, could provide the epoxy formulation with die-removal capability at around 200°C. The epoxy-additive interactions were studied and the results are presented in this paper. These include study of the interactions between the underfill composition and several additives before and after curing. The results showed that the additives did not interfere with epoxy curing and adversely affect the epoxy properties. However, when the additive decomposition temperature was reached, the decomposition of the additive caused a large CTE increase in the epoxy matrix
  • Keywords
    chip-on-board packaging; encapsulation; flip-chip devices; heat treatment; integrated circuit packaging; integrated circuit reliability; maintenance engineering; polymer films; pyrolysis; thermal expansion; 200 C; CTE; FCOB packages; IC chip; additive decomposition temperature; additive-modified epoxies; curing; die-removal capability; epoxy curing; epoxy formulation; epoxy matrix; epoxy properties; epoxy-additive interaction; epoxy-additive interactions; epoxy-based thermally reworkable underfills; flip chip technology; flip-chip applications; flip-chip devices; gap filling; nonreworkability; organic board; reliability; reworkability; reworkable underfill encapsulant; silica filled epoxy-based materials; solder interconnect encapsulation; solder interconnects; thermally reworkable underfills; underfill composition; underfill encapsulant; underfill encapsulants; underfill material; unknown bad die; Additives; Curing; Electronic packaging thermal management; Flip chip; Integrated circuit packaging; Materials reliability; Materials science and technology; Silicon compounds; Soldering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 1999. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-56-4
  • Type

    conf

  • DOI
    10.1109/ISAPM.1999.757338
  • Filename
    757338