• DocumentCode
    2702844
  • Title

    Compound sacrificial layer process for RF MEMS applications

  • Author

    Zhang, Yong-hua ; Wang, Chao ; Ouyang, Wei-xia ; Lai, Zong-sheng

  • Author_Institution
    Inst. of Microelectron. Circuit & Syst., East China Normal Univ., Shanghai, China
  • fYear
    2009
  • fDate
    27-29 Oct. 2009
  • Firstpage
    485
  • Lastpage
    487
  • Abstract
    Compound sacrificial layer has been developed for RF membrane bridge switch in micro electro mechanical systems (MEMS) tunable filters. The compound sacrificial layer consisting of polyimide and positive photoresist is used to avoid drawbacks which will occur when only polyimide or positive photoresist is used as sacrificial layer for suspended membrane with large area. The wet etching and dry etching are used to remove positive photoresist and polyimide, respectively. And the results of baking and etching of sacrificial layer are improved. The time is also shortened for the complete removal of sacrificial layer.
  • Keywords
    etching; micromechanical devices; microswitches; photoresists; radiofrequency filters; RF MEMS applications; RF membrane bridge switch; compound sacrificial layer process; dry etching; microelectromechanical systems tunable filters; polyimide photoresist; positive photoresist; wet etching; Biomembranes; Bridge circuits; Filters; Mechanical systems; Micromechanical devices; Polyimides; Radio frequency; Radiofrequency microelectromechanical systems; Resists; Switches; MEMS; RF switch; compound sacrificial layer; polyimide; positive photoresist;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4076-4
  • Type

    conf

  • DOI
    10.1109/MAPE.2009.5355590
  • Filename
    5355590