DocumentCode
2702844
Title
Compound sacrificial layer process for RF MEMS applications
Author
Zhang, Yong-hua ; Wang, Chao ; Ouyang, Wei-xia ; Lai, Zong-sheng
Author_Institution
Inst. of Microelectron. Circuit & Syst., East China Normal Univ., Shanghai, China
fYear
2009
fDate
27-29 Oct. 2009
Firstpage
485
Lastpage
487
Abstract
Compound sacrificial layer has been developed for RF membrane bridge switch in micro electro mechanical systems (MEMS) tunable filters. The compound sacrificial layer consisting of polyimide and positive photoresist is used to avoid drawbacks which will occur when only polyimide or positive photoresist is used as sacrificial layer for suspended membrane with large area. The wet etching and dry etching are used to remove positive photoresist and polyimide, respectively. And the results of baking and etching of sacrificial layer are improved. The time is also shortened for the complete removal of sacrificial layer.
Keywords
etching; micromechanical devices; microswitches; photoresists; radiofrequency filters; RF MEMS applications; RF membrane bridge switch; compound sacrificial layer process; dry etching; microelectromechanical systems tunable filters; polyimide photoresist; positive photoresist; wet etching; Biomembranes; Bridge circuits; Filters; Mechanical systems; Micromechanical devices; Polyimides; Radio frequency; Radiofrequency microelectromechanical systems; Resists; Switches; MEMS; RF switch; compound sacrificial layer; polyimide; positive photoresist;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4076-4
Type
conf
DOI
10.1109/MAPE.2009.5355590
Filename
5355590
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