• DocumentCode
    2703335
  • Title

    A new accurate method for semiconductor device modelling

  • Author

    Axelrad, V.

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ., Munich, West Germany
  • fYear
    1989
  • fDate
    17-19 May 1989
  • Firstpage
    116
  • Lastpage
    120
  • Abstract
    A method for the numerical modeling of semiconductor devices is presented. The method is based on the classical Fourier approach. Discretization of the differential equations is achieved through trigonometric-series expansions in a Galerkin procedure. The use of fast Fourier transform techniques renders the algorithm computationally effective. The Fourier method assures infinite-order accurate solutions of the strongly nonlinear semiconductor equations. Excellent numerical conditioning and high efficiency of the method offer major advantages for simulation of complex nonlinear VLSI devices, where high accuracy, numerical stability and flexibility are of major concern. Properties of the method are demonstrated on application examples
  • Keywords
    fast Fourier transforms; nonlinear differential equations; semiconductor device models; FFT based method; Galerkin procedure; complex nonlinear VLSI devices; differential equations; fast Fourier transform; infinite-order accurate solutions; nonlinear semiconductor equations; numerical modeling; numerical stability; semiconductor device modelling; trigonometric-series expansions; Computational modeling; Conductors; Degradation; Differential equations; Fast Fourier transforms; Integrated circuit modeling; Nonlinear equations; Numerical models; Numerical stability; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Applications, 1989. Proceedings of Technical Papers. 1989 International Symposium on
  • Conference_Location
    Taipei
  • Type

    conf

  • DOI
    10.1109/VTSA.1989.68595
  • Filename
    68595