• DocumentCode
    2704319
  • Title

    Temperature dependent mechanical behavior of plastic packaging materials

  • Author

    Darveaux, Robert ; Norton, Laura ; Carney, Frank

  • Author_Institution
    Adv. Packaging Design & Autom. Centre, Motorola Inc., Chandler, AZ, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    1054
  • Lastpage
    1058
  • Abstract
    This paper outlines sample preparation methodology and provides mechanical property data for commonly used plastic packaging materials. Included are die attach epoxies, mold compounds, liquid encapsulants (glob top material), printed circuit board laminate, and solder mask. Elastic modulus and thermal expansivity were characterized in the temperature range between -65°C and 260°C. Where possible, data were measured on samples cut from actual product to account for any microstructural effects that are process dependent. If special samples had to be fabricated, they were first subjected to the temperature profiles expected in actual manufacturing processes before being tested. The main effect of these added thermal exposures was to increase the glass transition temperature
  • Keywords
    elastic moduli; encapsulation; glass transition; laminates; plastic packaging; polymers; printed circuits; thermal analysis; thermal expansion; -65 to 260 C; PCB laminate; die attach epoxies; elastic modulus; glass transition temperature; glob top material; liquid encapsulants; mechanical property data; microstructural effects; mold compounds; plastic packaging materials; printed circuit board laminate; sample preparation methodology; solder mask; temperature dependent mechanical behavior; thermal expansivity; thermal exposures; Laminates; Manufacturing processes; Mechanical factors; Microassembly; Plastic packaging; Printed circuits; Temperature dependence; Temperature distribution; Testing; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.517821
  • Filename
    517821