• DocumentCode
    2705668
  • Title

    Methods for Efficiently Computing the MoM Impedance Matrix for APEx Type Basis Functions

  • Author

    Tap, K. ; Burkholder, R.J. ; Pathak, P.H. ; Albani, M.

  • Author_Institution
    ElectroScience Lab., Ohio State Univ., Columbus, OH
  • fYear
    2006
  • fDate
    9-14 July 2006
  • Firstpage
    4119
  • Lastpage
    4122
  • Abstract
    Alternative methods for efficiently computing the elements of the impedance matrix arising in the method-of-moments (MoM) based asymptotic phasefront extraction (APEx) method are presented. In APEx, the number of unknowns can be drastically reduced by making use of the phasefront characteristics of the local currents at smooth parts of the scatterer obtained at a lower frequency. At the high frequency of interest, the scaled basis functions are in the form of linearly phased constant amplitude currents or traveling waves (TWs) defined on supports that are significantly larger than the ones for the conventional MoM. The standard way of computing the mutual coupling impedance between these TW basis/test functions requires a 4-fold numerical surface integration on the supports (or patches) that typically are a few wavelengths long over a single dimension. Specifically, three different methods are investigated to efficiently and accurately compute the mutual coupling impedance. The advantages and disadvantages as well as the range of applicability of each method are discussed. Accuracy and CPU time comparisons are provided
  • Keywords
    electromagnetic coupling; impedance matrix; integration; method of moments; 4-fold numerical surface integration; APEx type basis functions; MoM impedance matrix; TW basis functions; asymptotic phasefront extraction method; linearly phased constant amplitude currents; method-of-moments; mutual coupling impedance; phasefront characteristics; scaled basis functions; test functions; traveling waves; Data mining; Frequency; Impedance; Laboratories; Message-oriented middleware; Moment methods; Mutual coupling; Scattering; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium 2006, IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    1-4244-0123-2
  • Type

    conf

  • DOI
    10.1109/APS.2006.1711534
  • Filename
    1711534