• DocumentCode
    2706004
  • Title

    Modeling of vacuum reed failure by using finite element method

  • Author

    Xu, Liang-jun ; Zhang, Ji-gao ; Miedzinski, Bogdan

  • Author_Institution
    Beijing Univ. of Posts & Telecommun., China
  • fYear
    2000
  • fDate
    25-27 Sept. 2000
  • Firstpage
    115
  • Lastpage
    119
  • Abstract
    The "volcano" phenomenon, a kind of vacuum reed failure, and the possible mechanism of this failure have been discussed previously. For further verification of the conclusions and improvement of the design, a failure simulation model based on finite element analysis is established. The calculation result based on the simulation model is satisfactorily consistent with the investigation. It is also found that overheating at the contact area leads to plastic extension, where residual tensile stress is produced, resulting in cracks on the surface. The parameters and their influences, which affect the failure, are discussed.
  • Keywords
    contact resistance; cracks; electrical contacts; failure analysis; finite element analysis; heating; internal stresses; plastic deformation; reed relays; vacuum switches; wear; contact area; failure mechanism; failure simulation model; finite element analysis; finite element method; modeling; overheating; plastic extension; reed relay design; residual tensile stress; simulation model; surface cracks; vacuum reed failure; volcano phenomenon; Blades; Contacts; Failure analysis; Finite element methods; Relays; Switches; Temperature; Tungsten; Vacuum technology; Volcanoes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-5960-7
  • Type

    conf

  • DOI
    10.1109/HOLM.2000.889920
  • Filename
    889920