DocumentCode
2707243
Title
Scalable and efficient integrated test architecture
Author
Portolan, Michele ; Goyal, Suresh ; Van Treuren, Bradford
Author_Institution
Bell Labs. Ireland, Dublin, Ireland
fYear
2009
fDate
1-6 Nov. 2009
Firstpage
1
Lastpage
1
Abstract
This paper presents the test instruction set architecture (TISA), an invention that can enable scalable interactive testing to leverage the experience of embedded computing. This approach is applied to an 1149.1 system, obtaining a processor able to efficiently handle instrument-based operations.
Keywords
instruction sets; integrated circuit testing; logic CAD; 1149.1 system; embedded computing; instrument-based operation; integrated test architecture; processor; scalable interactive testing; test instruction set architecture; Circuit testing; Computer architecture; Coprocessors; Electronic equipment testing; Embedded computing; Instruction sets; Instruments; Life testing; Remote monitoring; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2009. ITC 2009. International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4868-5
Electronic_ISBN
978-1-4244-4867-8
Type
conf
DOI
10.1109/TEST.2009.5355811
Filename
5355811
Link To Document