VLSI circuit challenges for integrated sensing systems

Author

Wise, K.D.

fYear

1990

fDate

7-9 June 1990

Firstpage

10

Lastpage

22

Abstract

The challenges facing the development of monolithic instrumentation systems are reviewed. Sensor technology is discussed, and examples of merging transducer and circuit processes are given. It is noted that, for many future systems, transducers, analog circuits, logic, and memory should probably be merged on a single chip, and system-level standards are needed to focus such efforts. It is concluded that microcomputer-based sensing nodes capable of functioning as smart peripherals and employing features such as self-testing, autocalibration, and PROM-based digital compensation should be realizable on a single chip within a decade

Keywords

VLSI; application specific integrated circuits; digital signal processing chips; electric sensing devices; error compensation; integrated circuit technology; signal processing equipment; transducers; PROM-based digital compensation; VLSI circuit challenges; autocalibration; features; integrated sensing systems; merging transducer and circuit processes; microcomputer-based sensing nodes; mixed-mode ASICs; monolithic instrumentation systems; on-chip transducers; self-testing; sensor technology; signal conditioning circuits; single chip; smart peripherals;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1990. Digest of Technical Papers., 1990 Symposium on

Conference_Location

Honolulu, Hawaii, USA

Type

conf

DOI

10.1109/VLSIC.1990.111130

Filename

5727562