• DocumentCode
    2708527
  • Title

    Corrosion induced electrostatic damage

  • Author

    Franey, John P.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • fYear
    2000
  • fDate
    26-28 Sept. 2000
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    As electronic components use less material, they become more sensitive to voltage and current variations. This increases their operational speed and functionality. Corrosion that was previously inconsequential now becomes a major factor in current electronic components. These problems take on a myriad of new consequences. Of these new problems, the tribocharging and consequent discharging of differential surfaces can be significant. Defects from melted circuits that fail initially, or later in the field (latent defects), or noise generation created by microwave discharges occur. This noise can cause digital service interruption by creating catastrophic bit rate errors. This paper shows these ESD events can take place on matched metal surfaces within 5 to 30 minutes following etching.
  • Keywords
    circuit noise; corrosion; electronic equipment testing; electrostatic discharge; error statistics; etching; high-frequency discharges; static electrification; triboelectricity; 5 to 30 min; ESD events; catastrophic bit rate errors; corrosion; corrosion induced electrostatic damage; current variations; differential surfaces; digital service interruption; discharging; electronic component materials; electronic components; etching; field failure; functionality; latent defects; matched metal surfaces; melted circuit defects; melted circuit failure; microwave discharges; noise; noise generation; operational speed; tribocharging; voltage variations; Bit rate; Circuit noise; Corrosion; Electronic components; Electrostatics; Microwave circuits; Microwave generation; Noise generators; Surface discharges; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-58537-018-5
  • Type

    conf

  • DOI
    10.1109/EOSESD.2000.890105
  • Filename
    890105