• DocumentCode
    2709121
  • Title

    Correlating Dielectric Properties of Melons with Quality

  • Author

    Nelson, Stuart O. ; Trabelsi, Samir ; Kays, Stanley J.

  • Author_Institution
    Agric. Res. Service, US Dept. of Agric., Athens, GA
  • fYear
    2006
  • fDate
    9-14 July 2006
  • Firstpage
    4849
  • Lastpage
    4852
  • Abstract
    Visible and physical characteristics of many fresh fruits and vegetables are available for correlation with maturity and/or quality, and some of these, such as color, density, elasticity, and firmness, are used in automatic sorting of some produce into different categories for the market. For the honeydew melon, however, no useful characteristics of this type have been found for reliable correlation with maturity or quality related to eating preference. The best criterion for melon quality is soluble solids, which are mostly sugars, and therefore a measure of sweetness. Therefore honeydew melons were grown and harvested with a range of maturities and soluble solids contents for dielectric spectroscopy measurements of the melon tissue to learn whether differences in the dielectric properties might exist that could be correlated with quality. This required the extraction of tissue samples from the melons and measurement of expressed juice with a refractometer, which has been calibrated to indicate percentage of soluble solids
  • Keywords
    agricultural products; dielectric measurement; dielectric properties; spectroscopy; automatic sorting; dielectric spectroscopy measurements; eating preference; honeydew melon; melon dielectric properties; melon quality; reliable correlation; soluble solids; sweetness measurement; tissue sample extraction; Coaxial components; Dielectric loss measurement; Dielectric measurements; Electric variables measurement; Frequency measurement; Impedance measurement; Moisture; Permittivity measurement; Probes; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium 2006, IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    1-4244-0123-2
  • Type

    conf

  • DOI
    10.1109/APS.2006.1711729
  • Filename
    1711729