A test chip for ISFET/CMNOS technology development

Author

Lui, A. ; Margesin, B. ; Zanini, V. ; Zen, M. ; Soncini, G. ; Martinoia, S.

Author_Institution

Microsensors & Syst. Integration Div., IRST, Povo, Italy

fYear

1996

fDate

25-28 Mar 1996

Firstpage

123

Lastpage

128

Abstract

A dedicated test chip has been designed and fabricated for assessing the compatibility of the ISFET (Ion Sensitive Field Effect Transistors) and CMNOS (Complementary Metal gate Nitride Oxide Semiconductor) technologies, in order to develop an ISFET/CMOS fabrication process. The test chip contains three sets of test structures dedicated respectively to the evaluation of the sensor performances in terms of electro-chemical characteristics, to the extraction of the CMNOS process/design (e.g. SPICE) parameters, and to the characterisation of basic analogue integrated circuit blocks for the on chip interface electronics. By using this technology single chemical sensors, arrays sensors and multi-sensors with on-chip signal conditioning for environmental and biomedical applications are currently under development in our laboratory

Keywords

CMOS analogue integrated circuits; chemical sensors; electrochemical analysis; integrated circuit technology; integrated circuit testing; ion sensitive field effect transistors; ISFET/CMNOS technology; SPICE parameters; analogue integrated circuit; array sensor; biomedical applications; electrochemical sensor; environmental applications; multisensor; on chip interface electronics; signal conditioning; test chip; CMOS process; CMOS technology; Chemical sensors; Circuit testing; FETs; Fabrication; Performance evaluation; Semiconductor device testing; Sensor arrays; Sensor phenomena and characterization;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on

Conference_Location

Trento

Print_ISBN

0-7803-2783-7

Type

conf

DOI

10.1109/ICMTS.1996.535632

Filename

535632